Manufacturer:KLA Corporation
Model:KLA 5105
Type:Advanced Inspection Module
Application:Semiconductor Wafer Inspection
Detection Capability:Sub-50nm Defects
Resolution:High Resolution Imaging
Software:Integrated Inspection Software Suite
Inspection Rate:Up to 200 wafers per hour
Dimensions:Width: 60cm, Height: 120cm, Depth: 80cm
Weight:Approximately 500kg
Power Requirements:220V AC, 50/60Hz
Operating Environment:Temperature: 18°C to 25°C, Humidity: 20% to 80%
The KLA KLA 5105 Precision Metrology Module is an advanced tool designed specifically for the semiconductor industry. With its high-precision measurements, it ensures that critical dimensions are within acceptable tolerances, enhancing the overall quality of semiconductor devices. This module supports a wide range of applications including inspection, defect analysis, and process monitoring.
The KLA 5105 is built using state-of-the-art technology that guarantees robust performance under various environmental conditions. Its compact design allows for easy integration into existing manufacturing systems without compromising on space. Additionally, the user-friendly interface makes it simple for operators to configure and use the module effectively.
Equipped with a high-resolution sensor system, the KLA 5105 delivers unparalleled accuracy in measurement. It is compatible with standard communication interfaces like Ethernet and USB, facilitating seamless data transfer and integration with other tools and systems. The module also supports a broad operating temperature range, ensuring reliable operation in diverse environments.
To ensure maximum reliability and durability, the KLA 5105 undergoes rigorous testing and quality assurance processes. It complies with international standards and regulations, making it a trusted choice for semiconductor manufacturers worldwide.
Invest in the KLA KLA 5105 Precision Metrology Module today to elevate the precision and efficiency of your semiconductor production processes.
There are no reviews yet.